Publications Measurement Technology
2019
Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019
https://doi.org/10.1109/TUFFC.2019.2951312
Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker
Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019
https://doi.org/10.1364/AO.58.00G256
Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.
Ultrasonics, Volume 100, January 2020, online Aug. 2019
https://doi.org/10.1016/j.ultras.2019.105984
Lorenzo Valzania, Peter Zolliker, Erwin Hack
Optica Vol. 6,Issue 4,pp. 518-523, (2019)
Marhenke T, Sanabria S, Chintada B, Furrer R, Neuenschwander J & Goksel O
Sensors, 19(4), 863. 2019
Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.
Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.
Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019
Arno Römmeler, Roman Furrer, Urs Sennhauser, Bastian Lübke, Jörg Wermelinger, Antonio de Agostini, Jürg Dual, Peter Zolliker, Jürg Neuenschwander
NDT & E International published online 17. Dec. 2018
2018
Hack, E., Valzania, L., Zolliker, P.
Physik in unserer Zeit, 49(6), 290-295. Nov 2018
Seraina Anne Dual, Jan Michael Zimmermann, Jürg Neuenschwander, Nicholas Heinrich Cohrs, Natalia Solowjowa,Wendelin Jan Stark,Mirko Meboldt,Marianne Schmid Daners
Artificial Organs accepted 18.10.2018
Ziemann, T., Grossner, U., & Neuenschwander, J.
In 2018 IEEE 6th workshop on wide bandgap power devices and applications (WiPDA) (pp. 24-31).
B. Rheingans, R Furrer, J. Neuenschwander, I. Spies, A. Schumacher, S. Knappmann, L.P.H Jeurgens & J. Janczak-Rusch
J. Electron. Packag 140(4), 041006 (2018)
Authors: Marhenke, T., Neuenschwander, J., Furrer, R., Twiefel, J., Hasener, J., Niemz, P., & Sanabria, S. J.;
NDT and E International; Volume 99, October 2018, Pages 1-12
Valzania, L., Hack, E., Zolliker, P., Brönnimann, R., & Feurer, T.;
Proceedings of SPIE: Vol. 10677. Unconventional optical imaging;
Erwick Hack, et al.;
The 18th International Conference on Experimental Mechanics (ICEM18) Brussels, Belgium;
https://doi.org/10.3390/ICEM18-05216
Strassel, K., Kaiser, A., Jenatsch, S., Véron, A. C., Anantharaman, S. B., Hack, E., … Hany, R.;
ACS Applied Materials and Interfaces;
Steiger, R., Fink, G., Nerbano, S., Hack, E., & Beyer, K.;
Materials and Structures, 51, 2 (14 pp.). (2018);
Valzania, L., Feurer, T., Zolliker, P., & Hack, E.;
Optics Letters, 43(3), 543-546.;
2017
Authors: Sanabria, S. J., Marhenke, T., Furrer, R., & Neuenschwander, J.;
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;
Dec. 05, 2017: Published in Advanced Science;
Authors: Gesevičius, D., Neels, A., Jenatsch, S., Hack, E., Viani, L., Athanasopoulos, S., … Heier, J.;
Valzania, L., Zolliker, P., & Hack, E.
In Proceedings of the 42nd international conference on infrared, millimeter and terahertz waves IRMMW-THz 2017
Zolliker, P., Rüggeberg, M., Valzania, L., & Hack, E. (2017).
IEEE Transactions on Terahertz Science and Technology, 7(6), 722-731. 2017
Madiba, I.G., Émond, N., Chaker, M., Thema, F.T., Tadadjeu, S.I., Muller, U., Zolliker, P., Braun, A.,Kotsedi, L., Maaza, M.
Applied Surface Science, 411, 271-278.
https://doi.org/10.1016/j.apsusc.2017.03.131
Jenatsch, S., Wang, L., Leclaire, N., Hack, E., Steim, R., Anantharaman, S., Heier, J., Ruhstaller, B., Penninck, L., Nüesch, F., Hany, R.
Organic Electronics, 48, 77-84. , 2017
Leclaire, N. A., Boudoire, F., Hack, E., Brönnimann, R., Nüesch, F. A., & Heier, J.
Advanced Optical Materials, 5(5), 1600903 (10 pp.).2017
Valzania, L., Zolliker, P., & Hack, E.
Optics Express, 25(10), 11038-11047. 2017
Evangelisti, F., Stiefel, M., Guseva, O., Nia, Raheleh P., Hauert, Roland., Hack, E., Jeurgens, L. P.H., Ambrosio, F., Pasquarello, A., Schmutz, P., Cancellieri, C.
Electrochimica Acta, 224, 503-516., 2017