Transport at Nanoscale Interfaces

Measurement Technology

Publications Measurement Technology

2021

Patterson, E. A., Diamantakos, I., Dvurecenska, K., Greene, R. J., Hack, E., Lampeas, G., Lomnitz M. & Siebert, T. 

Journal of Strain Analysis for Engineering Design. (2021). 

https://doi.org/10.1177/03093247211059084

Fish, G. C., Moreno-Naranjo, J. M., Billion, A., Kratzert, D., Hack, E., Krossing, I., Nüesch F. & Moser, J. E. 

Physical Chemistry Chemical Physics, 23(41), 23886-23895. (2021)

https://doi.org/10.1039/D1CP03251H

Mavrona E, Rajabali S, Appugliese F, Andberger J, Beck M, Scalari G & Faist J

 ACS Photonics (2021)

https://doi.org/10.1021/acsphotonics.1c00717

Zeng Z, Mavrona E, Sacré D, Kummer N, Cao J, Müller LAE, Hack E, Zolliker P & Nyström G

 ACS Nano, 15(4), 7451-7462. (2021)

https://doi.org/10.1021/acsnano.1c00856

Mavrona, E., Graf, J., Hack, E., & Zolliker, P. 

Optical Materials Express, 11(8), 2495-2504. (2021)

https://doi.org/10.1364/OME.428378

Dvurecenska, K., Diamantakos, I., Hack, E., Lampeas, G., Patterson, E. A., & Siebert, T.

Journal of Strain Analysis for Engineering Design, 56(4), 265-272. 2021

https://doi.org/10.1177/030932472097114

2020

Dettlaff, K. M., Mavrona, E., Zolliker, P., & Hack, E.
Optics Letters, 47(7), 1814-1817. (2022)

Patterson, E. A., Diamantakos, I., Dvurecenska, K., Greene, R. J., Hack, E., Lampeas, G., Lomnitz M. & Siebert, T. 

Journal of Strain Analysis for Engineering Design. (2021). 

https://doi.org/10.1177/03093247211059084

Fish, G. C., Moreno-Naranjo, J. M., Billion, A., Kratzert, D., Hack, E., Krossing, I., Nüesch F. & Moser, J. E. 

Physical Chemistry Chemical Physics, 23(41), 23886-23895. (2021)

https://doi.org/10.1039/D1CP03251H

Mavrona E, Rajabali S, Appugliese F, Andberger J, Beck M, Scalari G & Faist J

 ACS Photonics (2021)

https://doi.org/10.1021/acsphotonics.1c00717

Zeng Z, Mavrona E, Sacré D, Kummer N, Cao J, Müller LAE, Hack E, Zolliker P & Nyström G

 ACS Nano, 15(4), 7451-7462. (2021)

https://doi.org/10.1021/acsnano.1c00856

Mavrona, E., Graf, J., Hack, E., & Zolliker, P. 

Optical Materials Express, 11(8), 2495-2504. (2021)

https://doi.org/10.1364/OME.428378

Dvurecenska, K., Diamantakos, I., Hack, E., Lampeas, G., Patterson, E. A., & Siebert, T.

Journal of Strain Analysis for Engineering Design, 56(4), 265-272. 2021

https://doi.org/10.1177/030932472097114

Valzania, L., Dong, J., & Gigan, S. 

Optics Letters, 46(6), 1357 (4 pp.) (2021)

https://doi.org/10.1364/OL.406156

Senica U, Mavrona E, Olariu T, Forrer A, Shahmohammadi M, Beck M, Faist J & Scalari G

Applied Physics Letters, 116(16), 161105 (5 pp.) 2020

https://doi.org/10.1063/5.0004038

Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker

Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019
https://doi.org/10.1364/AO.58.00G256

Anantharaman S., Strassel K., Diethelm M., Gubicza A., Hack E., Hany R., Nüesch F. and Heier J.
Journal of Mater. Chem. C, 2019, Accepted Manuscript

Verma A, Martineau D, Hack E, Makha M, Turner E, Nüesch F & Heier J

Journal of Materials Chemistry C.

https://doi.org/10.1039/D0TC00327A

Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019
https://doi.org/10.1109/TUFFC.2019.2951312

Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.

Ultrasonics, Volume 100, January 2020, online Aug. 2019
https://doi.org/10.1016/j.ultras.2019.105984

Lorenzo Valzania, Peter Zolliker, Erwin Hack 

Optica Vol. 6,Issue 4,pp. 518-523, (2019)

https://doi.org/10.1364/OPTICA.6.000518

Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.

https://doi.org/10.1016/j.nimb.2019.01.039

2019

Anantharaman S., Strassel K., Diethelm M., Gubicza A., Hack E., Hany R., Nüesch F. and Heier J.
Journal of Mater. Chem. C, 2019, Accepted Manuscript

Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019
https://doi.org/10.1109/TUFFC.2019.2951312

Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker

Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019
https://doi.org/10.1364/AO.58.00G256

Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.

Ultrasonics, Volume 100, January 2020, online Aug. 2019
https://doi.org/10.1016/j.ultras.2019.105984

Lorenzo Valzania, Peter Zolliker, Erwin Hack 

Optica Vol. 6,Issue 4,pp. 518-523, (2019)

https://doi.org/10.1364/OPTICA.6.000518

Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.

https://doi.org/10.1016/j.nimb.2019.01.039

Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.

Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019

https://doi.org/10.1039/C8TC05286G

Arno Römmeler, Roman Furrer, Urs Sennhauser, Bastian Lübke, Jörg Wermelinger, Antonio de  Agostini, Jürg Dual, Peter Zolliker, Jürg Neuenschwander

NDT & E International published online 17. Dec. 2018

https://doi.org/10.1016/j.ndteint.2018.12.004

 

2018

Hack, E., Valzania, L., Zolliker, P.

Physik in unserer Zeit, 49(6), 290-295. Nov 2018

https://doi.org/10.1002/piuz.201801521

Seraina Anne Dual, Jan Michael Zimmermann, Jürg Neuenschwander, Nicholas Heinrich Cohrs, Natalia Solowjowa,Wendelin Jan Stark,Mirko Meboldt,Marianne Schmid Daners

Artificial Organs accepted 18.10.2018

https://doi.org/10.1111/aor.13379

Ziemann, T., Grossner, U., & Neuenschwander, J.

In 2018 IEEE 6th workshop on wide bandgap power devices and applications (WiPDA) (pp. 24-31).

https://doi.org/10.1109/WiPDA.2018.8569138

B. Rheingans, R Furrer, J. Neuenschwander, I. Spies, A. Schumacher, S. Knappmann, L.P.H Jeurgens & J. Janczak-Rusch

J. Electron. Packag 140(4), 041006 (2018)

https://doi.org/10.1115/1.4040978

Authors: Marhenke, T., Neuenschwander, J., Furrer, R., Twiefel, J., Hasener, J., Niemz, P., & Sanabria, S. J.;

NDT and E International; Volume 99, October 2018, Pages 1-12

 

https://doi.org/10.1016/j.ndteint.2018.05.012

Valzania, L., Hack, E., Zolliker, P., Brönnimann, R., & Feurer, T.;

Proceedings of SPIE: Vol. 10677. Unconventional optical imaging;

https://doi.org/10.1117/12.2307157

Erwick Hack, et al.; 

The 18th International Conference on Experimental Mechanics (ICEM18) Brussels, Belgium; 

https://doi.org/10.3390/ICEM18-05216

 

Strassel, K., Kaiser, A., Jenatsch, S., Véron, A. C., Anantharaman, S. B., Hack, E., … Hany, R.;

ACS Applied Materials and Interfaces;

https://doi.org/10.1021/acsami.8b00047

Valzania, L., Feurer, T., Zolliker, P., & Hack, E.;

Optics Letters, 43(3), 543-546.; 

https://doi.org/10.1364/OL.43.000543

 

2017

Authors: Sanabria, S. J., Marhenke, T., Furrer, R., & Neuenschwander, J.;

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;

https://doi.org/10.1109/TUFFC.2017.2773619

Dec. 05, 2017: Published in Advanced Science;

Authors: Gesevičius, D., Neels, A., Jenatsch, S., Hack, E., Viani, L., Athanasopoulos, S., … Heier, J.;

https://doi.org/10.1002/advs.201700496

Valzania, L., Zolliker, P., & Hack, E.

 In Proceedings of the 42nd international conference on infrared, millimeter and terahertz waves IRMMW-THz 2017

https://doi.org/10.1109/IRMMW-THz.2017.8067016

Zolliker, P., Rüggeberg, M., Valzania, L., & Hack, E. (2017).

IEEE Transactions on Terahertz Science and Technology, 7(6), 722-731. 2017

https://doi.org/10.1109/TTHZ.2017.2755508

Madiba, I.G., Émond, N., Chaker, M., Thema, F.T., Tadadjeu, S.I., Muller, U., Zolliker, P., Braun, A.,Kotsedi, L., Maaza, M.

 Applied Surface Science, 411, 271-278.

https://doi.org/10.1016/j.apsusc.2017.03.131

 

Jenatsch, S., Wang, L., Leclaire, N., Hack, E., Steim, R., Anantharaman, S., Heier, J., Ruhstaller, B., Penninck, L., Nüesch, F., Hany, R.

Organic Electronics, 48, 77-84. , 2017

https://doi.org/10.1016/j.orgel.2017.05.038

Leclaire, N. A., Boudoire, F., Hack, E., Brönnimann, R., Nüesch, F. A., & Heier, J.

Advanced Optical Materials, 5(5), 1600903 (10 pp.).2017

https://doi.org/10.1002/adom.201600903

Valzania, L., Zolliker, P., & Hack, E. 

Optics Express, 25(10), 11038-11047. 2017

https://doi.org/10.1364/OE.25.011038

Evangelisti, F., Stiefel, M., Guseva, O., Nia, Raheleh P., Hauert, Roland., Hack, E., Jeurgens, L. P.H., Ambrosio, F., Pasquarello, A., Schmutz, P., Cancellieri, C.

Electrochimica Acta, 224, 503-516., 2017

https://doi.org/10.1016/j.electacta.2016.12.090