Transport at Nanoscale Interfaces

Measurement Technology

Publications Measurement Technology

 

2019

Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019
https://doi.org/10.1109/TUFFC.2019.2951312

Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker

Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019
https://doi.org/10.1364/AO.58.00G256

Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.

Ultrasonics, Volume 100, January 2020, online Aug. 2019
https://doi.org/10.1016/j.ultras.2019.105984

Lorenzo Valzania, Peter Zolliker, Erwin Hack 

Optica Vol. 6,Issue 4,pp. 518-523, (2019)

https://doi.org/10.1364/OPTICA.6.000518

Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.

https://doi.org/10.1016/j.nimb.2019.01.039

Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.

Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019

https://doi.org/10.1039/C8TC05286G

Arno Römmeler, Roman Furrer, Urs Sennhauser, Bastian Lübke, Jörg Wermelinger, Antonio de  Agostini, Jürg Dual, Peter Zolliker, Jürg Neuenschwander

NDT & E International published online 17. Dec. 2018

https://doi.org/10.1016/j.ndteint.2018.12.004

 

2018

Hack, E., Valzania, L., Zolliker, P.

Physik in unserer Zeit, 49(6), 290-295. Nov 2018

https://doi.org/10.1002/piuz.201801521

Seraina Anne Dual, Jan Michael Zimmermann, Jürg Neuenschwander, Nicholas Heinrich Cohrs, Natalia Solowjowa,Wendelin Jan Stark,Mirko Meboldt,Marianne Schmid Daners

Artificial Organs accepted 18.10.2018

https://doi.org/10.1111/aor.13379

Ziemann, T., Grossner, U., & Neuenschwander, J.

In 2018 IEEE 6th workshop on wide bandgap power devices and applications (WiPDA) (pp. 24-31).

https://doi.org/10.1109/WiPDA.2018.8569138

B. Rheingans, R Furrer, J. Neuenschwander, I. Spies, A. Schumacher, S. Knappmann, L.P.H Jeurgens & J. Janczak-Rusch

J. Electron. Packag 140(4), 041006 (2018)

https://doi.org/10.1115/1.4040978

Authors: Marhenke, T., Neuenschwander, J., Furrer, R., Twiefel, J., Hasener, J., Niemz, P., & Sanabria, S. J.;

NDT and E International; Volume 99, October 2018, Pages 1-12

 

https://doi.org/10.1016/j.ndteint.2018.05.012

Valzania, L., Hack, E., Zolliker, P., Brönnimann, R., & Feurer, T.;

Proceedings of SPIE: Vol. 10677. Unconventional optical imaging;

https://doi.org/10.1117/12.2307157

Erwick Hack, et al.; 

The 18th International Conference on Experimental Mechanics (ICEM18) Brussels, Belgium; 

https://doi.org/10.3390/ICEM18-05216

 

Strassel, K., Kaiser, A., Jenatsch, S., Véron, A. C., Anantharaman, S. B., Hack, E., … Hany, R.;

ACS Applied Materials and Interfaces;

https://doi.org/10.1021/acsami.8b00047

Valzania, L., Feurer, T., Zolliker, P., & Hack, E.;

Optics Letters, 43(3), 543-546.; 

https://doi.org/10.1364/OL.43.000543

 

2017

Authors: Sanabria, S. J., Marhenke, T., Furrer, R., & Neuenschwander, J.;

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;

https://doi.org/10.1109/TUFFC.2017.2773619

Dec. 05, 2017: Published in Advanced Science;

Authors: Gesevičius, D., Neels, A., Jenatsch, S., Hack, E., Viani, L., Athanasopoulos, S., … Heier, J.;

https://doi.org/10.1002/advs.201700496

Valzania, L., Zolliker, P., & Hack, E.

 In Proceedings of the 42nd international conference on infrared, millimeter and terahertz waves IRMMW-THz 2017

https://doi.org/10.1109/IRMMW-THz.2017.8067016

Zolliker, P., Rüggeberg, M., Valzania, L., & Hack, E. (2017).

IEEE Transactions on Terahertz Science and Technology, 7(6), 722-731. 2017

https://doi.org/10.1109/TTHZ.2017.2755508

Madiba, I.G., Émond, N., Chaker, M., Thema, F.T., Tadadjeu, S.I., Muller, U., Zolliker, P., Braun, A.,Kotsedi, L., Maaza, M.

 Applied Surface Science, 411, 271-278.

https://doi.org/10.1016/j.apsusc.2017.03.131

 

Jenatsch, S., Wang, L., Leclaire, N., Hack, E., Steim, R., Anantharaman, S., Heier, J., Ruhstaller, B., Penninck, L., Nüesch, F., Hany, R.

Organic Electronics, 48, 77-84. , 2017

https://doi.org/10.1016/j.orgel.2017.05.038

Leclaire, N. A., Boudoire, F., Hack, E., Brönnimann, R., Nüesch, F. A., & Heier, J.

Advanced Optical Materials, 5(5), 1600903 (10 pp.).2017

https://doi.org/10.1002/adom.201600903

Valzania, L., Zolliker, P., & Hack, E. 

Optics Express, 25(10), 11038-11047. 2017

https://doi.org/10.1364/OE.25.011038

Evangelisti, F., Stiefel, M., Guseva, O., Nia, Raheleh P., Hauert, Roland., Hack, E., Jeurgens, L. P.H., Ambrosio, F., Pasquarello, A., Schmutz, P., Cancellieri, C.

Electrochimica Acta, 224, 503-516., 2017

https://doi.org/10.1016/j.electacta.2016.12.090