Nanomaterials Spectroscopy and Imaging
Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.
Research Areas
Recent Publications
Middleton, C. A., Amjad, K., Greene, R. J., Hack, E., Harris, L., Kupferschmid, A., Lambert PR. & Patterson, E. A.
Journal of Strain Analysis for Engineering Design. (2024)
Aeppli, D., Gartmann, J., Schneider, R., Hack, E., Kretschmer, S., Nguyen, T. T. D., & Held, M.
Journal of Energy Storage, 83, 110571 (12 pp.). (2024).
Mavrona, E., Theodosi, A., Mackosz, K., Perivolari, E., Utke, I., Michler, J., Schwiedrzik J, Kafesaki M, Tsilipakos O & Xomalis, A.
Optical Materials Express, 13(11), 3355 (10 pp.). (2023).
Adams, P., Schnyder, R., Moehl, T., Bühler, J., Alvarez, A. L., Dimitrievska, M., McKenna K, Yang W & Tilley, S. D.
Advanced Functional Materials, 2310596 (9 pp.). (2023).
Hack, E., Shorubalko, I., Graf, J., Zolliker, P., & Mavrona, E.
Optics Express, 31(18), 29968-29974. (2023).