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Transport at Nanoscale Interfaces

Publications

Publications

We work with the DORA system (Digital Object Repository at Empa) to archive our publications. As a publicly funded institution within the ETH domain, Empa is committed to disseminating its research and scholarship as widely as possible and has signed the Berlin Declaration on Open Access to Knowledge in the Sciences and Humanities.

Ulianova V, Rasheed F, Bolat S, Torres Sevilla G, Didenko Y, Feng X, Shorubalko I, Bachmann D, Tatarchuk D, Tahoori MB, Aghassi-Hagmann J & Romanyuk YE

IEEE Access, 8, 111783-111790. 2020

https://doi.org/10.1109/ACCESS.2020.3002267

Authors: Sanabria, S. J., Marhenke, T., Furrer, R., & Neuenschwander, J.;

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;

https://doi.org/10.1109/TUFFC.2017.2773619

Dec. 05, 2017: Published in Advanced Science;

Authors: Gesevičius, D., Neels, A., Jenatsch, S., Hack, E., Viani, L., Athanasopoulos, S., … Heier, J.;

https://doi.org/10.1002/advs.201700496

Kenel, C., Lis, A., Dawson, K., Stiefel, M., Pecnik, C., Barras, J., Colella, A., Hauser, C., Tatlock, G.J., Leinenbach, C., Wegener, K.

Intermetallics, 91, 169-180., 2017

https://doi.org/10.1016/j.intermet.2017.09.004

 

Nov 27, 2017: Published at Bautechnik - Zeitschrift für den gesamten Ingenieurbau;

Authors: Peter Anderegg,  Dr. Rolf Brönnimann,  Prof. Dr. h.c. Urs Meier;

https://doi.org/10.1002/bate.201700085

Perrin, M. L., Doelman, M., Eelkema, R., & van der Zant, H. S. J. (2017).

Physical Chemistry Chemical Physics, 19(43), 29187-29194., 2017

https://doi.org/10.1039/c7cp04456a

Valzania, L., Zolliker, P., & Hack, E.

 In Proceedings of the 42nd international conference on infrared, millimeter and terahertz waves IRMMW-THz 2017

https://doi.org/10.1109/IRMMW-THz.2017.8067016

Zolliker, P., Rüggeberg, M., Valzania, L., & Hack, E. (2017).

IEEE Transactions on Terahertz Science and Technology, 7(6), 722-731. 2017

https://doi.org/10.1109/TTHZ.2017.2755508

Pósa, L., El Abbassi, M., Makk, P., Sánta, B., Nef, C., Csontos, M., Calame, M., Halbritter, A.

Nano Letters, 17(11), 6783-6789., 2017 

https://doi.org/10.1021/acs.nanolett.7b03000

El Abbassi, M., Pósa, L., Makk, P., Nef, C., Thodkar, K., Halbritter, A., & Calame, M.

Nanoscale, 9(44), 17312-17317., 2017

https://doi.org/10.1039/C7NR05348G

Jacob, P., & Thiemann, U. (2017). 

Microelectronics and Reliability, 76-77, 395-399., 2017

https://doi.org/10.1016/j.microrel.2017.06.048

Jacob, P., & Furrer, R.

Microelectronics and Reliability, 76-77, 102-105, 2017

https://doi.org/10.1016/j.microrel.2017.06.058

Madiba, I.G., Émond, N., Chaker, M., Thema, F.T., Tadadjeu, S.I., Muller, U., Zolliker, P., Braun, A.,Kotsedi, L., Maaza, M.

 Applied Surface Science, 411, 271-278.

https://doi.org/10.1016/j.apsusc.2017.03.131

 

Thodkar, K., Thompson, D., Lüönd, F., Moser, L., Overney, F., Marot, L., Schönenberger, C., Jeanneret, B., Calame, M. (2017).

ACS Applied Materials and Interfaces, 9(29), 25014-25022. 2017

https://doi.org/10.1021/acsami.7b05143

Bissig B, Lingg M, Guerra-Nunez C, Carron R, La Mattina F, Utke I, Buecheler S & Tiwari AN

Thin Solid Films, 633, 218-221. 

https://doi.org/10.1016/j.tsf.2016.08.012

Modregger, P., Kagias, M., Irvine, S. C., Brönnimann, R., Jefimovs, K., Endrizzi, M., & Olivo, A. 

Physical Review Letters, 118(26), 265501 (6 pp.)., 2017

https://doi.org/10.1103/PhysRevLett.118.265501

Lal, S., Poulikakos, L., Jerjen, I., Vontobel, P., Partl, M. N., Derome, D., & Carmeliet, J.

Construction and Building Materials, 152, 82-95, 2017

https://doi.org/10.1016/j.conbuildmat.2017.06.145

Jenatsch, S., Wang, L., Leclaire, N., Hack, E., Steim, R., Anantharaman, S., Heier, J., Ruhstaller, B., Penninck, L., Nüesch, F., Hany, R.

Organic Electronics, 48, 77-84. , 2017

https://doi.org/10.1016/j.orgel.2017.05.038

Lal, S., Poulikakos, L. D., Jerjen, I., Vontobel, P., Partl, M. N., Derome, D., & Carmeliet, J.

Transport in Porous Media, 118, 119-142, 2017

https://doi.org/10.1007/s11242-017-0850-z

Guillaume-Gentil, O., Rey, T., Kiefer, P., Ibáñez, A. J., Steinhoff, R., Brönnimann, R., Dorwling-Carter, L., Zambelli, T., Zenobi, R., Vorholt, J. A.

 Analytical Chemistry, 89(9), 5017-5023., 2017

https://doi.org/10.1021/acs.analchem.7b00367

Shorubalko, I., Choi, K., Stiefel, M., & Park, H. G. (2017).

Beilstein Journal of Nanotechnology, 8, 682-687., 2017

https://doi.org/10.3762/bjnano.8.73

Stritt, C., Plamondon, M., Hofmann, J., Flisch, A., & Sennhauser, U.

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 848, 73-80.

https://doi.org/10.1016/j.nima.2016.12.044

Protesescu, L., Yakunin, S., Kumar, S., Bär, J., Bertolotti, F., Masciocchi, N., Guagliardi, A., Grotevent, M., Shorubalko, I., Bodnarchuk, M. I., Shih, C.-J., Kovalenko, M. V. 

ACS Nano, 11(3), 3119-3134., 2017

https://doi.org/10.1021/acsnano.7b00116

Leclaire, N. A., Boudoire, F., Hack, E., Brönnimann, R., Nüesch, F. A., & Heier, J.

Advanced Optical Materials, 5(5), 1600903 (10 pp.).2017

https://doi.org/10.1002/adom.201600903

Fairbrother, A., Sanchez-Valencia, J. R., Lauber, B., Shorubalko, I., Ruffieux, P., Hintermann, T., & Fasel, R.

Nanoscale, 9(8), 2785-2792., 2017

https://doi.org/10.1039/C6NR08975E

Alekhin, M.S., Renger, J., Kasperczyk, M., Douissard, P.-A., Martin, T., Zorenko, Y., Vasil'ev, D.A., Stiefel, M., Novotny, L., Stampanoni, M.

Optics Express, 25(2), 1251-1261. 2017

https://doi.org/10.1364/OE.25.001251

Valzania, L., Zolliker, P., & Hack, E. 

Optics Express, 25(10), 11038-11047. 2017

https://doi.org/10.1364/OE.25.011038

Keevend, K., Stiefel, M., Neuer, A. L., Matter, M. T., Neels, A., Bertazzo, S., & Herrmann, I. K. 

Nanoscale, 9(13), 4383-4387, 2017

https://doi.org/10.1039/c6nr09187c

Stoop, R. L., Thodkar, K., Sessolo, M., Bolink, H. J., Schönenberger, C., & Calame, M. (2017).

Physical Review Applied, 7(1), 014009 (8 pp.)., 2017

https://doi.org/10.1103/PhysRevApplied.7.014009

Evangelisti, F., Stiefel, M., Guseva, O., Nia, Raheleh P., Hauert, Roland., Hack, E., Jeurgens, L. P.H., Ambrosio, F., Pasquarello, A., Schmutz, P., Cancellieri, C.

Electrochimica Acta, 224, 503-516., 2017

https://doi.org/10.1016/j.electacta.2016.12.090

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