Transport at Nanoscale Interfaces

Publications

Authors: Sanabria, S. J., Marhenke, T., Furrer, R., & Neuenschwander, J.;

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;

https://doi.org/10.1109/TUFFC.2017.2773619

Dec. 05, 2017: Published in Advanced Science;

Authors: Gesevičius, D., Neels, A., Jenatsch, S., Hack, E., Viani, L., Athanasopoulos, S., … Heier, J.;

https://doi.org/10.1002/advs.201700496

Kenel, C., Lis, A., Dawson, K., Stiefel, M., Pecnik, C., Barras, J., Colella, A., Hauser, C., Tatlock, G.J., Leinenbach, C., Wegener, K.

Intermetallics, 91, 169-180., 2017

https://doi.org/10.1016/j.intermet.2017.09.004

 

Nov 27, 2017: Published at Bautechnik - Zeitschrift für den gesamten Ingenieurbau;

Authors: Peter Anderegg,  Dr. Rolf Brönnimann,  Prof. Dr. h.c. Urs Meier;

https://doi.org/10.1002/bate.201700085

Perrin, M. L., Doelman, M., Eelkema, R., & van der Zant, H. S. J. (2017).

Physical Chemistry Chemical Physics, 19(43), 29187-29194., 2017

https://doi.org/10.1039/c7cp04456a

Valzania, L., Zolliker, P., & Hack, E.

 In Proceedings of the 42nd international conference on infrared, millimeter and terahertz waves IRMMW-THz 2017

https://doi.org/10.1109/IRMMW-THz.2017.8067016

Zolliker, P., Rüggeberg, M., Valzania, L., & Hack, E. (2017).

IEEE Transactions on Terahertz Science and Technology, 7(6), 722-731. 2017

https://doi.org/10.1109/TTHZ.2017.2755508

Pósa, L., El Abbassi, M., Makk, P., Sánta, B., Nef, C., Csontos, M., Calame, M., Halbritter, A.

Nano Letters, 17(11), 6783-6789., 2017 

https://doi.org/10.1021/acs.nanolett.7b03000

El Abbassi, M., Pósa, L., Makk, P., Nef, C., Thodkar, K., Halbritter, A., & Calame, M.

Nanoscale, 9(44), 17312-17317., 2017

https://doi.org/10.1039/C7NR05348G

Jacob, P., & Thiemann, U. (2017). 

Microelectronics and Reliability, 76-77, 395-399., 2017

https://doi.org/10.1016/j.microrel.2017.06.048

Jacob, P., & Furrer, R.

Microelectronics and Reliability, 76-77, 102-105, 2017

https://doi.org/10.1016/j.microrel.2017.06.058

Madiba, I.G., Émond, N., Chaker, M., Thema, F.T., Tadadjeu, S.I., Muller, U., Zolliker, P., Braun, A.,Kotsedi, L., Maaza, M.

 Applied Surface Science, 411, 271-278.

https://doi.org/10.1016/j.apsusc.2017.03.131

 

Thodkar, K., Thompson, D., Lüönd, F., Moser, L., Overney, F., Marot, L., Schönenberger, C., Jeanneret, B., Calame, M. (2017).

ACS Applied Materials and Interfaces, 9(29), 25014-25022. 2017

https://doi.org/10.1021/acsami.7b05143

Bissig B, Lingg M, Guerra-Nunez C, Carron R, La Mattina F, Utke I, Buecheler S & Tiwari AN

Thin Solid Films, 633, 218-221. 

https://doi.org/10.1016/j.tsf.2016.08.012

Modregger, P., Kagias, M., Irvine, S. C., Brönnimann, R., Jefimovs, K., Endrizzi, M., & Olivo, A. 

Physical Review Letters, 118(26), 265501 (6 pp.)., 2017

https://doi.org/10.1103/PhysRevLett.118.265501

Lal, S., Poulikakos, L., Jerjen, I., Vontobel, P., Partl, M. N., Derome, D., & Carmeliet, J.

Construction and Building Materials, 152, 82-95, 2017

https://doi.org/10.1016/j.conbuildmat.2017.06.145

Jenatsch, S., Wang, L., Leclaire, N., Hack, E., Steim, R., Anantharaman, S., Heier, J., Ruhstaller, B., Penninck, L., Nüesch, F., Hany, R.

Organic Electronics, 48, 77-84. , 2017

https://doi.org/10.1016/j.orgel.2017.05.038

Lal, S., Poulikakos, L. D., Jerjen, I., Vontobel, P., Partl, M. N., Derome, D., & Carmeliet, J.

Transport in Porous Media, 118, 119-142, 2017

https://doi.org/10.1007/s11242-017-0850-z

Guillaume-Gentil, O., Rey, T., Kiefer, P., Ibáñez, A. J., Steinhoff, R., Brönnimann, R., Dorwling-Carter, L., Zambelli, T., Zenobi, R., Vorholt, J. A.

 Analytical Chemistry, 89(9), 5017-5023., 2017

https://doi.org/10.1021/acs.analchem.7b00367

Shorubalko, I., Choi, K., Stiefel, M., & Park, H. G. (2017).

Beilstein Journal of Nanotechnology, 8, 682-687., 2017

https://doi.org/10.3762/bjnano.8.73

Stritt, C., Plamondon, M., Hofmann, J., Flisch, A., & Sennhauser, U.

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 848, 73-80.

https://doi.org/10.1016/j.nima.2016.12.044

Protesescu, L., Yakunin, S., Kumar, S., Bär, J., Bertolotti, F., Masciocchi, N., Guagliardi, A., Grotevent, M., Shorubalko, I., Bodnarchuk, M. I., Shih, C.-J., Kovalenko, M. V. 

ACS Nano, 11(3), 3119-3134., 2017

https://doi.org/10.1021/acsnano.7b00116

Leclaire, N. A., Boudoire, F., Hack, E., Brönnimann, R., Nüesch, F. A., & Heier, J.

Advanced Optical Materials, 5(5), 1600903 (10 pp.).2017

https://doi.org/10.1002/adom.201600903

Fairbrother, A., Sanchez-Valencia, J. R., Lauber, B., Shorubalko, I., Ruffieux, P., Hintermann, T., & Fasel, R.

Nanoscale, 9(8), 2785-2792., 2017

https://doi.org/10.1039/C6NR08975E

Alekhin, M.S., Renger, J., Kasperczyk, M., Douissard, P.-A., Martin, T., Zorenko, Y., Vasil'ev, D.A., Stiefel, M., Novotny, L., Stampanoni, M.

Optics Express, 25(2), 1251-1261. 2017

https://doi.org/10.1364/OE.25.001251

Valzania, L., Zolliker, P., & Hack, E. 

Optics Express, 25(10), 11038-11047. 2017

https://doi.org/10.1364/OE.25.011038

Keevend, K., Stiefel, M., Neuer, A. L., Matter, M. T., Neels, A., Bertazzo, S., & Herrmann, I. K. 

Nanoscale, 9(13), 4383-4387, 2017

https://doi.org/10.1039/c6nr09187c

Stoop, R. L., Thodkar, K., Sessolo, M., Bolink, H. J., Schönenberger, C., & Calame, M. (2017).

Physical Review Applied, 7(1), 014009 (8 pp.)., 2017

https://doi.org/10.1103/PhysRevApplied.7.014009

Evangelisti, F., Stiefel, M., Guseva, O., Nia, Raheleh P., Hauert, Roland., Hack, E., Jeurgens, L. P.H., Ambrosio, F., Pasquarello, A., Schmutz, P., Cancellieri, C.

Electrochimica Acta, 224, 503-516., 2017

https://doi.org/10.1016/j.electacta.2016.12.090