Transport at Nanoscale Interfaces

Publications

Cabosart, D.; El Abbassi, M.; Stefani, D.; Frisenda, R.; Calame, M.; Van der Zant, H. S. J.; Perrin, M. L. 

Appl. Phys. Lett. 2019, 114 (14), 143102.

https://doi.org/10.1063/1.5089198

Lorenzo Valzania, Peter Zolliker, Erwin Hack 

Optica Vol. 6,Issue 4,pp. 518-523, (2019)

https://doi.org/10.1364/OPTICA.6.000518

Pardo, A.; Ilic, E.; Thorwarth, K.; Stiefel, M.; Hauert, R.

Science and Technology of Advanced Materials 2019, 20 (1), 173-186.
https://doi.org/10.1080/14686996.2019.1580483

Grotevent MJ, Hail CU, Yakunin S, Dirin DN, Thodkar K, Borin Barin G, Guyot‐Sionnest P, Calame M, Poulikakos D, Kovalenko MV & Shorubalko I

Advanced Optical Materials, 1900019 (2019)

https://doi.org/10.1002/adom.201900019

 

Sánta B, Balogh Z, Gubicza A, Pósa L, Krisztián D, Mihály G, Csontos M & Halbritter A

Nanoscale, 11(11), 4719-4725. 2019

https://doi.org/10.1039/C8NR09985E

Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.

https://doi.org/10.1016/j.nimb.2019.01.039

Anton Vladyka, Mickael L. Perrin, Jan Overbeck, Rubén R. Ferradás, Víctor García-Suárez, Markus Gantenbein, Jan Brunner, Marcel Mayor, Jaime Ferrer and Michel Calame

Nature Communications 10, 262 (2019)

DOI: https://doi.org/10.1038/s41467-018-08025-9

Rheingans, B., Spies, I., Schumacher, A., Knappmann, S., Furrer, R., Jeurgens, L. P. H., & Janczak-Rusch, J. 

Applied Sciences, 9(2), 262 (11 pp.). 2019

https://doi.org/10.3390/app9020262

Ju, W., Zeng, J., Bejtka, K., Ma, H., Rentsch, D., Castellino, M., Sacco, A., Pirri, C. F., Battaglia, C.  

ACS Applied Energy Materials. (2019)

https://doi.org/10.1021/acsaem.8b01944

Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.

Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019

https://doi.org/10.1039/C8TC05286G

Arno Römmeler, Roman Furrer, Urs Sennhauser, Bastian Lübke, Jörg Wermelinger, Antonio de  Agostini, Jürg Dual, Peter Zolliker, Jürg Neuenschwander

NDT & E International published online 17. Dec. 2018

https://doi.org/10.1016/j.ndteint.2018.12.004