Center for X-ray Analytics
Empa’s Center for X-ray Analytics enforces X-ray analytical method developments for materials science and technologies with the aim to support Swiss and European science and industrial innovation. The development of new materials is strongly connected to the possibilities for a comprehensive analysis of their properties. Analytical methods do not only provide knowledge about the materials, but also support understanding of the production process of these materials.
The Center for X-ray Analytics is dedicated to exploit and continuously improve X-ray based analysis methods to support material research also under different environmental conditions.
The center works on progress on X-ray based analytics related to materials research and technology which is done in partnerships with academic institutions and industry. Application areas are new materials in a broad sense for example components or systems in metallurgy, semiconductor industry, chemistry, pharmacy and biology. Our core activities relate with the evaluation of the structure – property relationships. We also focus on studies under different non-ambient environmental conditions, which give access to structure dynamics.
Outstanding characterization methods for microstructural investigations are developed by:
- X-ray absorption Computed Tomography combined with 3D image processing/analysis approaches for a broad range of materials, e.g., concrete, wood, microsystems, food, bones and biological materials
- X-ray Diffraction Techniques: HRXRD, 2D-XRD, WAXS, GI-XRD for Single Crystals, Powders and Thin Films
- X-ray Small Angle Scattering: SAXS combined with WAXS, 2D-SAXS
Technological progress is followed up with our research and the parallel development of analytical tools. Related to our competencies, we are open to discuss challenging topics with you and are happy to enter into collaborations and participate to common projects.
We are happy to assist you in your scientific and technology progress!
CCMX Advanced Course 'Advanced X-ray Diffraction Methods for Coatings: Strain, Defects and Deformation Analysis of Thin Films‘
November 27 – 29th 2017
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