BRUKER Nanostar

The BRUKER Nanostar is a versatile bench-top apparatus with an X-ray source with Cu-radiation, microfocus pinholes and a VÅNTEC-2000 Xenon-based gas detector. The system uses a semi-transparent beam stop enabling perfect background subtraction and a high resolution for such a lab-based system. The modulable sample to detector distance ranging from 5 cm to 167 cm makes the Nanostar an ideal piece of equipment for studying mineral or amorphous structures expressed in the wide-angle and long-range structural characteristics in the small-angle range. 










Image: Company Antona Paar, Small-angle X-ray scattering (SAXS) probes structure in the nanometre to micrometre range by measuring scattering intensity at scattering angles 2θ close to 0°


  • Operation in transmission mode (SAXS) and reflection mode (GISAXS)
  • Possibility to switch between SAXS and WAXS modes by sample to detector distance (SDD) variation
  • Temperature scans (-20 to 150 °C)
  • In situ-tensile studies
  • Microfluidics-SAXS
  • In situ external magnetic field studies




  •     Polymers, particles and proteins in solution
  •     Polymer films, membranes and fabrics
  •     Mesoporous powders
  •     Gels, self-assemblies and liquid crystalline materials
  •     Nanoscale coated surfaces

Structural parameters:

  •     Particles/proteins size, shape and interactions (i.e. nano-bio) in solution
  •     Characterisation of nano-domains and chain configuration in polymer systems
  •     Porosity and internal morphology
  •     Structures in lipid/peptide self-assemblies
  •     Coated layer thicknesses and structure of molecular assemblies on the surfaces

We collaborate in the frame of national and international projects and support research inside and outside Empa based on mutual agreement and interest.

Prof. Dr. Antonia Neels

Prof. Dr. Antonia Neels
Head of the Center for X-ray Analytics

Phone: +41 58 765 4507