Personal details


Michael Stiefel
 
 
Title
Mr
Company
Empa
ZIP / City
Country
Professional expertise
Electron and ion microscopy (SEM,TEM,FIB) and related analytical techniques (EDX,EBIC,CL, etc.), coordination of FIB - activities, TEM sample preparation, optical failure localization (IR,EMMI/OBIRCH), failure analysis of electronic components and systems,