Unser Team


 
Last Name
Stiefel
Michael Stiefel
First Name
Michael
Professional expertise
Electron and ion microscopy (SEM,TEM,FIB) and related analytical techniques (EDX,EBIC,CL, etc.), coordination of FIB - activities, TEM sample preparation, optical failure localization (IR,EMMI/OBIRCH), failure analysis of electronic components and systems,

 
Last Name
Aeppli
Daniel Aeppli
First Name
Daniel
Professional expertise
Batterien (Ausfallmechanismen, Elektrische Charakterisierung, Lebensdauer- und Sicherheitstests, etc.), Chemie (Präparation und Analytik)
Add. Information
Qualitätssicherungsbeauftragter (QSB) und Sicherheitskoordinator (SIKO) ZEZ

 
Last Name
Furrer
Roman Furrer
First Name
Roman
Professional expertise
CVD Graphene, Infrared (Temperature, active + passive Thermography), Ultrasonics, uCT, Failure analysis on electronic devices, Partial discharge measurements

 
Last Name
Held
Marcel Held
First Name
Marcel
Phone

 
Last Name
Kretschmer
Sebastian Kretschmer
First Name
Sebastian
Phone