CV Erwin Hack

Dr. phil Erwin Kurt Hack, *12 May 1961, from Zurich, Switzerland

Empa, Transport at Nanoscale Interfaces Laboratory
Überlandstrasse 129
CH-8600 Dübendorf

+41 58 765 42 73

ORCID      0000-0003-1547-9889
Scopus Author ID   7004000719

Positions
2002 – present Senior Scientist, Empa
2007 – present Lecturer at ETH Zurich, Department of Mechanical and Process Engineering, on Optical Methods in Experimental Mechanics
2002 – present Member of Empa’s Research Commission
1995 – 2016 Deputy Head of Laboratory
1991 – 2001 Scientist, Electronics/Metrology Laboratory, Empa
1986 – 1990  PhD student, Institute of Physical Chemistry, University of Zurich
1983 – 1990 Assistant lecturer in Physics and Physical Chemistry, University of Zurich



 

Education

1990                 PhD in Physical Chemistry, University of Zurich,
                          "Theory of Stark Quantum Beat Spectroscopy of Polyatomic Molecules"
1986                 Diploma in Theoretical Physics, University of Zurich, on "Static Electromagnetic Corrections to 0+→ 0+ Fermi β decay"
1979                 Classical Matura (Type B), Frauenfeld

Languages       German (native speaker), English (C1), French (B2), Italian (B1), Dutch (A2)

Software          Matlab, CompleteEASE, OPTOCAT, Fiji, SAP, MS Office applications

 

Management development

2015                  Business English (Torquay International School)
2011 – 2014     Management Training (Empa, several topical modules)
2007                  Management II (Stufenseminar Führung 2, EPA)
1996                  Management I  (Stufenseminar Führung 1, EPA)
1996                  Project Management (BWI)

Professional interests
  • Spectroscopic ellipsometry
  • THz imaging
  • Digital holography
  • Speckle pattern interferometry
  • IR-thermography
  • Calibration, validation and measurement uncertainty
Supervision of Junior Researchers

Doctoral thesis advisor  for Lorenzo Valzania (Uni Bern, 2015-2019),
Doctoral thesis advisor  for Daniel Iwaniuk  (EPFL, 2007-2011)
Doctoral thesis advisor  for Phanindra Narayan Gundu (EPFL, 2002-2007)

Co-Referee for four doctoral theses in optics at EPFL (2006, 2009, 2010, 2012)
Membre de Jury de Thèse for a doctoral thesis in electronics (Université Bordeaux 1, 2005)
Faculty Opponent for a doctoral thesis in optics (Luleå University of Technology, 2004)

Active Memberships
  • Editor in Chief of Optics and Lasers in Engineering
  • Vice-president of the „Swiss Society for Non-destructive Testing“ (SGZP)
  • Vice-Chair of CEN WS71 - Validation of computational solid mechanics models using strain fields from calibrated measurements
  • Senior Member of OSA (Optical Society of America)
  • Member of EOS (European Optical Society), SSOM (Swiss society for optics and microscopy) and the Physical Society of Zurich (PGZ)
  • Reviewer for SCI/E journals, including Applied Optics, J.Opt.Soc.Am.A, Journal of Optics, Measurement Science and Technology, NDT&E, Optical Engineering, Optics and Lasers in Engineering, Optics Communications, Optics Express, Proc. Roy. Soc. A

Past Memberships

  • Associate Editor and Deputy Editor of Optics and Lasers in Engineering (2012-2019)
  • Member of Editorial Board of Optics and Lasers in Engineering (1999-2012)
  • Member of VAMAS (Versailles project on Advanced Materials And Standards), TWA26 (Full field optical stress and strain measurement) (2006-2014)
  • Conference chair of Combined Optical and Imaging Methods in Experimental Mechanics (2016)
  • Conference chair of Advanced Phase Measurement Methods in Optics and Imaging (2010)
  • Member of the scientific committee in international conferences (ICEM 16 2014, Photomechanics 2006, 2008, 2011, 2013, 2015, 2018; Speckle 2006, 2010 and 2012; SEM-conference ISEV- 2011; DACH-Tagung ZfP 2004 and 2008)
  • Member of optETH (Network of Optical Sciences and Technologies at the ETH) (2006-2011)
  • Member of Scientific Advisory Board of ISBRI (“Indo Swiss Bilateral Research Initiative” of the Swiss State Secretariat for Education and Research) 2007-2008
  • Member of Sectorial Committee on NDE of metas (Swiss accreditation body) (2004-2006)
  • Member of DGZfP-Ausschuss/VDI/VDE-GMA "Optische Formerfassung" (1993-1998)