Aurelio Borzì obtained his Ph.D. at the "Universitè Bourgogne Franche-Comté" in Besançon and CEA-Leti in Grenoble (France) in 2020, after graduating in Materials Chemistry at the University of Catania (Italy). 

Since 2020 he is a postdoc researcher at the Center for X-ray Analytics, at Empa (Swiss Federal Laboratories for Materials Science and Technology).

In his Ph.D. work, he focused on the fabrication and performance characterization of acoustic filters to be implemented in the RF front-end of the 5G network. His research concentrates on the characterization of the structure of the materials using X-ray-related methods, such as powder X-ray diffraction (XRPD), high-resolution X-ray diffraction (HRXRD), and X-ray reflectometry (XRR). He applies these methods in the study of the crystalline quality of thin films with different microstructural features (from quasi-amorphous to epitaxial films), the correlation of MEMS-microfabrication processes to the materials microstructure degradation, the improvement of BIO-coatings performances.

He is a member of the Swiss Crystallographic Society since 2020.