Measurement Technology
Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.
Research Areas
Recent Publications
Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.
Ultrasonics, Volume 100, January 2020, online Aug. 2019
https://doi.org/10.1016/j.ultras.2019.105984
Lorenzo Valzania, Peter Zolliker, Erwin Hack
Optica Vol. 6,Issue 4,pp. 518-523, (2019)
Marhenke T, Sanabria S, Chintada B, Furrer R, Neuenschwander J & Goksel O
Sensors, 19(4), 863. 2019
Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.
Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.
Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019