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Transport at Nanoscale Interfaces

Measurement Technology

Measurement Technology

Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.

Research Areas

Current Research Projects



Recent Publications

Bachmann, D., Brönnimann, R., Caceres, L. N., Gnannt, S., Hack, E., Mavrona, E., Sacré D. &Zolliker, P. 

Applied Sciences, 13(4), 2747 (11 pp.). (2023)

Mavrona, E., Hu, Y., De Freitas Siqueira, G., Rüggeberg, M., Popov, S., Berglund, L. A., Hack E., Nyström G. & Zolliker, P. (2023).

Optical Materials Express, 13(1), 92-103. (2023)

Dettlaff, K. M., Mavrona, E., Zolliker, P., & Hack, E.
Optics Letters, 47(7), 1814-1817. (2022)

Patterson, E. A., Diamantakos, I., Dvurecenska, K., Greene, R. J., Hack, E., Lampeas, G., Lomnitz M. & Siebert, T. 

Journal of Strain Analysis for Engineering Design. (2021).

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