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Transport at Nanoscale Interfaces

Measurement Technology

Measurement Technology

Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.

Research Areas

Current Research Projects

 

 


Recent Publications

Lorenzo Valzania, Peter Zolliker, Erwin Hack 

Optica Vol. 6,Issue 4,pp. 518-523, (2019)

https://doi.org/10.1364/OPTICA.6.000518

Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.

https://doi.org/10.1016/j.nimb.2019.01.039

Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.

Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019

https://doi.org/10.1039/C8TC05286G

Arno Römmeler, Roman Furrer, Urs Sennhauser, Bastian Lübke, Jörg Wermelinger, Antonio de  Agostini, Jürg Dual, Peter Zolliker, Jürg Neuenschwander

NDT & E International published online 17. Dec. 2018

https://doi.org/10.1016/j.ndteint.2018.12.004

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