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Transport at Nanoscale Interfaces

Measurement Technology

Measurement Technology

Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.

Research Areas

Current Research Projects

 

 


Recent Publications

B. Rheingans, R Furrer, J. Neuenschwander, I. Spies, A. Schumacher, S. Knappmann, L.P.H Jeurgens & J. Janczak-Rusch
J. Electron. Packag 140(4), 041006 (2018)
https://doi.org/10.1115/1.4040978

Authors: Marhenke, T., Neuenschwander, J., Furrer, R., Twiefel, J., Hasener, J., Niemz, P., & Sanabria, S. J.;

NDT and E International;

https://doi.org/10.1016/j.ndteint.2018.05.012

Valzania, L., Hack, E., Zolliker, P., Brönnimann, R., & Feurer, T.;

Proceedings of SPIE: Vol. 10677. Unconventional optical imaging;

https://doi.org/10.1117/12.2307157

Erwick Hack, et al.; 

The 18th International Conference on Experimental Mechanics (ICEM18) Brussels, Belgium; 

https://doi.org/10.3390/ICEM18-05216

 

Strassel, K., Kaiser, A., Jenatsch, S., Véron, A. C., Anantharaman, S. B., Hack, E., … Hany, R.;

ACS Applied Materials and Interfaces;

https://doi.org/10.1021/acsami.8b00047

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