Measurement Technology
Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.
Research Areas
Recent Publications
Verma A, Martineau D, Hack E, Makha M, Turner E, Nüesch F & Heier J
Journal of Materials Chemistry C.
Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019
https://doi.org/10.1109/TUFFC.2019.2951312
Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker
Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019
https://doi.org/10.1364/AO.58.00G256
Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.
Ultrasonics, Volume 100, January 2020, online Aug. 2019
https://doi.org/10.1016/j.ultras.2019.105984