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Transport at Nanoscale Interfaces

Measurement Technology

Measurement Technology

Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.

Research Areas

Current Research Projects



Recent Publications

Verma A, Martineau D, Hack E, Makha M, Turner E, Nüesch F & Heier J

Journal of Materials Chemistry C.

Anantharaman S., Strassel K., Diethelm M., Gubicza A., Hack E., Hany R., Nüesch F. and Heier J.
Journal of Mater. Chem. C, 2019, Accepted Manuscript

Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019

Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker

Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019

Römmeler A., Zolliker P., Neuenschwander J., Gemmeren V., Weder M., Dual J.

Ultrasonics, Volume 100, January 2020, online Aug. 2019

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