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Transport at Nanoscale Interfaces

Measurement Technology

Measurement Technology

Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.

Research Areas

Current Research Projects

 

 


Recent Publications

Senica U, Mavrona E, Olariu T, Forrer A, Shahmohammadi M, Beck M, Faist J & Scalari G

Applied Physics Letters, 116(16), 161105 (5 pp.) 2020

https://doi.org/10.1063/5.0004038

Verma A, Martineau D, Hack E, Makha M, Turner E, Nüesch F & Heier J

Journal of Materials Chemistry C.

https://doi.org/10.1039/D0TC00327A

Anantharaman S., Strassel K., Diethelm M., Gubicza A., Hack E., Hany R., Nüesch F. and Heier J.
Journal of Mater. Chem. C, 2019, Accepted Manuscript

Marhenke T, Neuenschwander J, Furrer R, Zolliker P, Twiefel J, Hasener J, Wallaschek J & Sanabria SJ

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, (13 pp.). 2019
https://doi.org/10.1109/TUFFC.2019.2951312

Lorenzo Valzania, Yuchen Zhao, Lu Rong, Dayong Wang, Marc Georges, Erwin Hack, and Peter Zolliker

Applied Optics Vol. 58, Issue 34, pp. G256-G275, 2019
https://doi.org/10.1364/AO.58.00G256

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