Measurement Technology
Materials research of structures on a millimeter/micrometer level and below using optical methods covering the wavelength range from the visible via infrared to the terahertz domain as well as ultrasonic technology. We have a broad experience and infrastructure in measurement technologies. On selected topics we initiate and perform internationally recognized research. At the same time we use our experience to collaborate with research partners in academia and industry.
Research Areas
Recent Publications
Lorenzo Valzania, Peter Zolliker, Erwin Hack
Optica Vol. 6,Issue 4,pp. 518-523, (2019)
Marhenke T, Sanabria S, Chintada B, Furrer R, Neuenschwander J & Goksel O
Sensors, 19(4), 863. 2019
Madiba IG, Émond N, Chaker M, Khanyile BS, Tadadjeu SI, Zolliker P, Izerrouken M, Matinise N, Braun A, Nkosi M & Maaza M
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 443, 25-30.
Gesevičius, D., Neels, A., Duchêne, L., Hack, E., Heier, J., & Nüesch, F.
Journal of Materials Chemistry C, 7(2), 414-423., Issue 2, 2019
Arno Römmeler, Roman Furrer, Urs Sennhauser, Bastian Lübke, Jörg Wermelinger, Antonio de Agostini, Jürg Dual, Peter Zolliker, Jürg Neuenschwander
NDT & E International published online 17. Dec. 2018