Dec. 13, 2018 Congratulation Pit!
Prof. Peter Jacob, Electronics & Reliability Center, received the 2018 Outstanding Paper Award for paper titled
“Power Device Burned Completely – And Now, How to Find the Root Cause? (Board and System session)” at
44th International Symposium for Testing and Failure Analysis held October 28 – November 1, 2018 at the Phoenix
Convention Center in Phoenix, AZ, USA.
As presenting author of the 2018 Outstanding Paper, ISTFA will be honoring him with an award at ISTFA 2019, which will be held in Portland, Oregon, USA, November 10-14, 2019. Congratulations!