Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

The group activities focus on the chemical characterization of surfaces and materials. This includes fundamental and applied research on a wide range of non-organic and organic devices and materials, state-of-the-art ToF-SIMS technology development and services for industry.
Scientific Research

The group research focuses on the chemical (elemental and molecular) characterization of functional surfaces and materials. Own and collaborative research is performed on a wide range of organic functional materials, biological materials and organic devices. The main fields of applications are Molecular Electronics, Functional Polymers, Bio-medical applications and Toxicity in bio-materials (see more).

What is ToF-SIMS ?

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a versatile analytical technique that provides detailed information on the chemical composition of the uppermost monolayers of a surface (see more).

The different ToF-SIMS modes of operation include:

Spectrometry: Chemical compositional analysis of homogeneous materials surfaces.

Imaging: 2D chemical mapping of hetero-structured or micro-fabricated materials surfaces.

Depth Profiling: In-depth chemical analysis of materials from surface to bulk.

3D chemical analysis: 3D chemical mapping of hetero-structured or micro-fabricated materials or devices.


  • People

Senior Scientist
Dr. Laetitia Bernard
CV

 

Postdoc
Dr. Olivier Scholder

 

Ph.D student
Maciej Kawecki