Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
The group research focuses on the chemical (elemental and molecular) characterization of functional surfaces and materials. Own and collaborative research is performed on a wide range of organic functional materials, biological materials and organic devices. The main fields of applications are Molecular Electronics, Functional Polymers, Bio-medical applications and Toxicity in bio-materials (see more).
What is ToF-SIMS ?
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a versatile analytical technique that provides detailed information on the chemical composition of the uppermost monolayers of a surface (see more).
The different ToF-SIMS modes of operation include:
Spectrometry: Chemical compositional analysis of homogeneous materials surfaces.
Imaging: 2D chemical mapping of hetero-structured or micro-fabricated materials surfaces.
Depth Profiling: In-depth chemical analysis of materials from surface to bulk.
3D chemical analysis: 3D chemical mapping of hetero-structured or micro-fabricated materials or devices.