Organic surface analytics
The Organic surface analytics divides into two banches:
- Empa/ETH time-of-flight secondary ion mass spectrometry (ToF-SIMS) facility that comprises ~ 20 internal and external users from academia and industry, and proposes analytical service to Swiss and European industries.
- ToF-SIMS research and development pole that includes fundamental and applied research on a wide range of devices and materials on one hand, and state-of-the -art ToF-SIMS methodology & technology development on the other hand.
Our research focuses on the chemical (elemental and molecular) characterization of functional surfaces and materials. Own and collaborative research is performed on a wide range of organic functional materials, biological materials and organic devices. The main fields of applications are Molecular Electronics, Functional Polymers, Bio-medical applications and Toxicity in bio-materials (see more).
Throughout our long-lasting collaboration with the German company IONTOF and in collaboration with various other Swiss and European companies, we develops advanced tools that permit to enlarge the versatility of the Time-of-Flight Secondary Ion Mass Spectrometry technology, mainly in the fields of organic-based devices and bio-medical applications. Dedicated operation modes, methodologies and advanced multi-dimensional data analysis techniques are also developed (see more).
With unique expertise on ToF-SIMS analytics, methodology and technology on one hand, and state-of-the-art equipment on the other hand, we support Swiss universities and research centers for their own research. Whereas punctual needs for specific chemical characterization are addressed by short-term inter-laboratory collaborations, long-term needs are addressed by training external users from the demanding institution or company, and providing them with technical and scientific support along their work (see more).
In accordance to the general mission of Empa, we offer high-quality analytical services to Swiss and European Industries who need chemical characterization of surfaces, interfaces or materials. Product quality, fabrication processes, pre-treatments, stability within specific conditions or aging can be evaluated qualitatively and semi-quantitatively via comparative analysis (see more).
Submit a service request at service request.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a versatile analytical technique that provides detailed information on the chemical composition of the uppermost monolayers of a surface (see more).
The different ToF-SIMS modes of operation include:
Spectrometry: Chemical compositional analysis of homogeneous materials surfaces.
Imaging: 2D chemical mapping of hetero-structured or micro-fabricated materials surfaces.
Depth Profiling: In-depth chemical analysis of materials from surface to bulk.
3D chemical analysis: 3D chemical mapping of hetero-structured or micro-fabricated materials or devices.