Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
The Organic surface analytics divides into two banches:
- the ToF-SIMS facility that comprises ~ 20 internal and external users from academia and industry, and proposes analytical service to Swiss and European industries.
- the ToF-SIMS research and development pole that includes fundamental and applied research on a wide range of devices and materials on one hand, and state-of-the -art ToF-SIMS methodology & technology development on the other hand.
The group research focuses on the chemical (elemental and molecular) characterization of functional surfaces and materials. Own and collaborative research is performed on a wide range of organic functional materials, biological materials and organic devices. The main fields of applications are Molecular Electronics, Functional Polymers, Bio-medical applications and Toxicity in bio-materials (see more).
In accordance to the general mission of Empa, the ToF-SIMS group offers high-quality analytical services to Swiss and European Industries who need chemical characterization of surfaces, interfaces or materials. Product quality, fabrication processes, pre-treatments, stability within specific conditions or aging can be evaluated qualitatively and semi-quantitatively (comparative analysis). The main applications encountered in this activity are the following:
- Surface and interface quality control
- Surface contamination, delamination, corrosion, etc
- Thin film analysis
- Diffusion processes
Examples of ToF-SIMS analytical measurements, within the various operational modes can be found under what is ToF-SIMS?
Submit a service request.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a versatile analytical technique that provides detailed information on the chemical composition of the uppermost monolayers of a surface (see more).
The different ToF-SIMS modes of operation include:
Spectrometry: Chemical compositional analysis of homogeneous materials surfaces.
Imaging: 2D chemical mapping of hetero-structured or micro-fabricated materials surfaces.
Depth Profiling: In-depth chemical analysis of materials from surface to bulk.
3D chemical analysis: 3D chemical mapping of hetero-structured or micro-fabricated materials or devices.