Transport at Nanoscale Interfaces Laboratory

Dec. 13, 2018 Congratulation Pit!

Prof. Peter Jacob received the 2018 Outstandig Paper Award for his paper "Power Device Burned Completely - ... "” at 44th International Symposium for Testing and Failure Analysis held Oct. 28 – Nov. 1, 2018 in Phoenix. Congratulations!

Press

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release: Outstanding Paper Award
Prof. Peter Jacob, Electronics & Reliability Center, received the 2018 Outstanding Paper Award for paper titled 
“Power Device Burned Completely – And Now, How to Find the Root Cause? (Board and System session)” at 
44th International Symposium for Testing and Failure Analysis held October 28 – November 1, 2018 at the Phoenix 
Convention Center in Phoenix, AZ, USA.

As presenting author of the 2018 Outstanding Paper, ISTFA will be honoring him with an award at ISTFA 2019, which will be held in Portland, Oregon, USA, November 10-14, 2019.  Congratulations!