| Expert articles of Urs Sennhauser |
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Characteristics of imaging fibre-bundles for use in an ESPI-based instrument for distributed high-resolution measurements |
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Title Characteristics of imaging fibre-bundles for use in an ESPI-based instrument for distributed high-resolution measurements Authors Hack. |
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Issue date: 2003.06.19 |
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Morphologic Investigations with X-ray Tomographic Microscopy (XTM) using Synchrotron Radiation |
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Title Morphologic Investigations with X-ray Tomographic Microscopy (XTM) using Synchrotron Radiation Authors Wyss P., Thurner Ph., Stampanoni. |
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Issue date: 2003.05.13 |
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Evaluation of coherent fibre-bundle characteristics for use in an ESPI-based instrument for measuring strain in electronic packages |
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Title Evaluation of coherent fibre-bundle characteristics for use in ESPI-base instrument for measuring strain in electronic packages Authors Dias-Lalcaca. |
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Issue date: 2003.05.13 |
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Tomography studies of human foreskin fibroblasts on polymer yarns |
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Title Tomography studies of human foreskin fibroblasts on polymer yarns Authors Thurner Ph., Müller B., Beckmann. |
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Issue date: 2003.02.03 |
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Monitoring CFRP Reinforced Structures |
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Title Monitoring CFRP Reinforced Structures Authors Brönnimann, R., Nellen, Ph.M., Sennhauser, U. Magazine/Conference Proceedings of the 3rd World Conference on Structural Control, Como (I) Vol+No+Page v/b Vol 2, January 2003,[...] |
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Issue date: 2003.02.03 |
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Reliabiliy of fiber Bragg grating based sensors for downhole applications |
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Title Reliability of fiber Bragg grating based sensors for downhole application Authors Nellen, Ph.M., Mauron, P., Frank,. |
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Issue date: 2003.02.02 |
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Novel FIB-based sample preparation technique for TEM analysis of ultra-thin gate oxide breakdown |
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Title Novel FIB-based sample sreparation technique for TEM analysis of ultra-thin gate oxide breakdown Authors Reiner,. |
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Issue date: 2002.10.16 |
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Reliable Long-term Monitoring of CFRP Cables in Bridges |
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Title Reliable Long-term Monitoring of CFRP Cables in Bridges Authors Anderegg, P., Brönnimann, R., Nellen, Ph.M., Sennhauser,. |
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Issue date: 2002.09.19 |
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Reliability of Nano-structured Materials and Devices, Final Report |
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Title Reliability of Nano-structured Materials and Devices, Final Report Authors Sennhauser, U., Held, M., Nellen, Ph.M., Reiner,. |
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Issue date: 2002.07.12 |
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FIB - ein Mikroskop als Werkbank
Focused Ion Beam für die Materialwissenschaften |
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Titel FIB - ein Mikroskop als Werkbank Autoren Sennhauser, U., Jacob, P. Zeitschrift/Konferenz GIT Inspect Vol+Nr+Seite v/b 2/2002,. |
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Issue date: 2002.06.01 |
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