Novel research in nanomechanics and nanostructuring requires specialised instrumentation, not all of which is available commercially. The microanalysis group within the Laboratory for Mechanics of Materials and Nanostructures has
- glow discharge instruments which are used for (quantitative) chemical depth profiling with nanometer depth resolution and part per million level detection limits. We have both GD-OES and GD-TOFMS instruments.
- a Raman microscope, capable of also using the surface-enhanced and tip-enhanced Raman effects (SERS and TERS respectively). This can be used for stress mapping on a sub-micron spatial scale.
- a high spatial resolution Secondary Ion Mass Spectrometer (SIMS), integrated within a dual beam SEM-FIB instrument. This is used for chemical imaging (including depth profiles) on a smaller spatial scale than can be accessed by the glow discharge instruments. more