Novel research in nanomechanics and nanostructuring requires specialised instrumentation, not all of which is available commercially. The microanalysis group within the Laboratory for Mechanics of Materials and Nanostructures has
- glow discharge instruments which are used for (quantitative) chemical depth profiling with nanometer depth resolution and part per million level detection limits. We have both GD-OES and GD-TOFMS instruments.
- a Raman microscope, capable of also using the surface-enhanced and tip-enhanced Raman effects (SERS and TERS respectively). This can be used for stress mapping on a sub-micron spatial scale.
- a high spatial resolution Secondary Ion Mass Spectrometer (SIMS), integrated within a dual beam SEM-FIB instrument. This is used for chemical imaging (including depth profiles) on a smaller spatial scale than can be accessed by the glow discharge instruments.
We maintain research interests in the use of radiofrequency pulsed glow discharges, in the application of glow discharge analysis to thin films and to molecular materials, in the coupling of time-resolved mass spectrometric detection to pulsed discharges and in the use of plasmonic effects to enhance Raman signals. We have custom made instruments which improve the lateral spatial resolution of a glow discharge one hundred times (from several millimeters to tens of microns), which permit the time-resolved mass spectral analysis of molecular species in afterglowing plasmas and which allow SIMS measurements with spatial resolutions down to 10 nm.
|